to absolute maximum rating conditions for extended periods may affect device reliability, ORDERING INFORMATION 6037 Part Package Temperature Range 2N5196 ~ Hermetic TO-71 -88C to +150C 2N5197 Hermetic TO-71 55C to +150C 2N5198 Hermetic TO-71 -55C to +150C X2N5198 Sorted Chips in Carriers 55C to +150C 2N5199 ~ Hermetic TO-71 -55C to +150C X2N5199 Sorted Chips in Carriers -55C to +150C ELECTRICAL CHARACTERISTICS (Ta = 25C unless otherwise specified) SYMBOL PARAMETER MIN | MAX | UNITS TEST CONDITIONS -26 pA | Vas =-30V, Vos = 0 I Gate Re Ci t 88 verse warren 50 | nA [Ta = 150C BVass Gate-Source Breakdown Voltage -50 la =-1pA, Vos = 0 Vasiom Gate-Source Cutoff Voltage 0.7 | 4 Vs Voa = 20V, Ip = 1nA Ves Gate-Source Voltage 0.2 = A Voa = 20V, Ip = 200pA la Gate Operating Current 5 7A [Tan 1258 = 108 loss Saturation Drain Current (Note 2) 0.7 7 mA_ | Vos = 20V, Vas #0 Ota Common-Source Forward Transconductance (Note 2) 1000 | 4000 Vos = 20V, Vag = 0 Ots Common-Source Forward Transconductance (Note 2) 70