BTA204S600E Triac
From Philips Semiconductors / NXP Semiconductors
@ t(w) (s) (Test Condition) | 20m |
@I(T) (A) (Test Condition) | 12 |
@Temp. (°C) (Test Condition) | 125 |
I(D) Max. (A) Leakage Current | 500u |
I(GT) Max. (A) | 10m |
I(H) Max.(A) Holding Current | 12m |
I(T(RMS)) Max.(A)On-State Cur. | 4.0 |
I(TSM) Max. (A) | 25 |
Package | SOT-428 |
V(DRM) Max.(V)Rep.Pk.Off Volt. | 600 |
V(GT) Max.(V) | 1.5 |
V(T) Max. (V) | 1.7 |
dv/dt Min. (V/us) | 30 |
t(gt) Typ. (s) | 2.0u |